Each reflection has an intensity (I) and an uncertainty in measurement
(sigma(I)), so I/sigma(I) is the signal-to-noise ratio. This
ratio decreases at higher resolution. <I/sigma(I)> is the mean of individual I/sigma(I)
values. Value for outer resolution shell is given in parentheses. In case
structure factor amplitudes are deposited, Xtriage estimates the intensities
first and then calculates this metric. When intensities are available in the
deposited file, these are converted to amplitudes and then back to intensity
estimate before calculating the metric.
X-ray entry specific, calculated by Phenix Xtriage program.