Allowed Value | Details |
---|---|
CLASSIFICATION | |
CRYSTALLOGRAPHY MERGING | |
CTF CORRECTION | |
DIFFRACTION INDEXING | |
EWALD SPHERE CORRECTION | |
FINAL EULER ASSIGNMENT | |
IMAGE ACQUISITION | |
INITIAL EULER ASSIGNMENT | |
LATTICE DISTORTION CORRECTION | |
LAYERLINE INDEXING | |
MASKING | |
MODEL FITTING | |
MODEL REFINEMENT | |
MOLECULAR REPLACEMENT | |
OTHER | |
PARTICLE SELECTION | |
RECONSTRUCTION | |
SERIES ALIGNMENT | |
SYMMETRY DETERMINATION | |
VOLUME SELECTION |
Allowed Value | Details |
---|---|
CLASSIFICATION | |
CRYSTALLOGRAPHY MERGING | |
CTF CORRECTION | |
DIFFRACTION INDEXING | |
EWALD SPHERE CORRECTION | |
FINAL EULER ASSIGNMENT | |
IMAGE ACQUISITION | |
INITIAL EULER ASSIGNMENT | |
LATTICE DISTORTION CORRECTION | |
LAYERLINE INDEXING | |
MASKING | |
MODEL FITTING | |
MODEL REFINEMENT | |
MOLECULAR REPLACEMENT | |
OTHER | |
PARTICLE SELECTION | |
RECONSTRUCTION | |
SERIES ALIGNMENT | |
SYMMETRY DETERMINATION | |
VOLUME SELECTION |