Data Item _diffrn_measurement.sample_tracking
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General 
- Item name
- _diffrn_measurement.sample_tracking
- Category name
- diffrn_measurement
- Attribute name
- sample_tracking
- Required in PDB entries
- no
- Used in current PDB entries
- No
Item Description
Originated from IUCr Electron Diffraction CIF
extension. Flag indicating if a tracking method to
follow the crystal was used in the data
acquisition. Typically used to track very small
crystals in electron diffraction experiments.
Data Type 
- Data type code
- code
- Data type detail
- code item types/single words ...
- Primitive data type code
- char
- Regular expression
- [][_,.;:"&<>()/\{}'`~!@#$%A-Za-z0-9*|+-]*
Controlled Vocabulary
| Allowed Value | Details |
|---|---|
| N | |
| Y |
Controlled Vocabulary at Deposition
| Allowed Value | Details |
|---|---|
| N | |
| Y |