Allowed Value | Details |
---|---|
population | Standard deviation from a population of many crystals, for example from serial crystallography |
propagated | Propagated error from several crystals |
refined | Errors are derived from a refined fit of the cell parameters to the data and represent the precision of that fit |
scan varying | Error using a scan varying restraint across the crystal as a whole |
single crystal | ESD for a single crystal |
window | ESD from measuring the unit cell using a moving window across many frames |
Allowed Value | Details |
---|---|
population | Standard deviation from a population of many crystals, for example from serial crystallography |
propagated | Propagated error from several crystals |
refined | Errors are derived from a refined fit of the cell parameters to the data and represent the precision of that fit |
scan varying | Error using a scan varying restraint across the crystal as a whole |
single crystal | ESD for a single crystal |
window | ESD from measuring the unit cell using a moving window across many frames |