The crystallographic reliability index Rcomplete for
	       reflections that satisfy the resolution limits
	       established by _refine.ls_d_res_high and
	       _refine.ls_d_res_low and the observation limit
	       established by _reflns.observed_criterion
               Ref: Luebben, J., Gruene, T., (2015). Proc.Nat.Acad.Sci. 112(29) 8999-9003