Average figure of merit of phases of reflections not included
               in the refinement.
               This value is derived from the likelihood function.
               FOM           = I1(X)/I0(X)
               I0, I1     = zero- and first-order modified Bessel functions
                               of the first kind
               X              = sigmaA |Eo| |Ec|/SIGMA
               Eo, Ec     = normalized observed and calculated structure
                               factors
               sigmaA       = <cos 2 pi s deltax> SQRT(SigmaP/SigmaN)
                               estimated using maximum likelihood
               SigmaP       = sum{atoms in model} f2
               SigmaN       = sum{atoms in crystal} f2
               f              = form factor of atoms
               deltax       = expected error
               SIGMA          = (sigma{E;exp})2 + epsilon [1-(sigmaA)2]
               sigma{E;exp} = uncertainties of normalized observed
                               structure factors
               epsilon       = multiplicity of the diffracting plane
               Ref: Murshudov, G. N., Vagin, A. A. & Dodson, E. J. (1997).
                    Acta Cryst. D53, 240-255.