Allowed Value | Details |
---|---|
detector | equipment used to detect reflections |
general | equipment used for general purposes |
goniometer | equipment used to orient or position samples |
gravity | axis specifying the downward direction |
source | axis specifying the direction sample to source |
Allowed Value | Details |
---|---|
detector | equipment used to detect reflections |
general | equipment used for general purposes |
goniometer | equipment used to orient or position samples |
gravity | axis specifying the downward direction |
source | axis specifying the direction sample to source |